 Life Science Microscopy Facility Home
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JEOL JSM-840 Scanning Electron MicroscopeLocated in: Life Science Microscopy Facility
This SEM is an older model but extremely reliable and stable. It is used for training and research primarily for samples imaged at magnifications below 50,000x.
Special features: Robinson Back scattering detector JEOL Digital imaging upgrade |
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FEI NOVA nanoSEM FESEMThe FEI NOVA nanoSEM high resolution FESEM can be used at both high and low vacuum and is equipped with multiple detectors including: ET (Everhart-Thornley), TLD (through-the-lens), STEM (scanning-transmission), GAD (gaseous analytical) and low vacuum (LVD and Helix) detectors. It is equipped with an OXFORD INCA 250 electron dispersive X-ray detector (EDX) and a GATAN ALTO 2500 cryo system that is optimized for use with field-emission SEMs. |
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GATAN Alto 2500 Cryo UnitThe cryo system, optomized for use on field-emission microscopes, consists of a freezing unit, a turbo-pumped cryo preparation unit, and a cryo stage that attaches to the microscope stage. The cryo system permits flash freezing of samples in liquid nitrogen slush followed by high vacuum sublimation of unbound water, Pt coating to minimize charge build-up and imaging at temperatures in the range of -100 to -140oC. |
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FEI Quanta 3D FEG Dual-beam SEMThe newly installed FEI Quanta 3D FEG is a dual-beam SEM having a field emission electron beam column and a gallium ion beam column. The ion beam can be used to ablate sample areas, under high vacuum, that are then imaged with the electron column. The microscope is also capable of imaging in low vacuum modes or in true environmental (ESEM) mode at high pressure and up to 100% humidity. This microscope is equipped with a GATAN ALTO 2500 cryo-system and OXFORD INCAPentaFET-x3 large area crystal EDX detector. | |
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